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Scanning Probe Microscopy.

SPM, Scanning Probe Microscopy, is the microscopy techniques where the sample is not imaged at once, but scanned line by line. Two of these techniques are AFM (Atomic Force Microscopy)and NSOM (Near-Field Scanning Optical Microscopy, sometimes also shortened SNOM).

NSOM enables you to look beyond the diffraction limit of normal optical spectroscopy, which is half the wavelength of the light used (with visible light about 0.3-0.4 µm). NSOM overcomes this limitation by delivering light through an aperture much smaller than the wavelength of the light and by holding the aperture much closer to the sample surface than this wavelength. The aperture used is typically an optical fibre which has been tapered down to a diameter of somewhere around 50-70 nm. The optical resolution can now be in the range of 70-100 nm in practical work. The optical fibre can also be used as an AFM
probe.

AFM is the technique for imaging surface topography with nanometric resolution. Contact, non-contact and
intermittent contact AFM probes are available for a variety of surfaces and for a range of materials and structures.

AFM image of PMMA spheres scaning range 45x45 μm

Nanonics patented glass probe tip can be used as an optical fiber for NSOM as well as an AFM tip.

NSOM picture showing the light propagation in a photonic band gap.

We can offer a number of systems ranging from single probe, high preformance instruments to Multi probe multiscanner state of the art research equipment. All are built on Nanonics unique open design platforms made possible by Nanonics award winning 3D Flatscan^TM piezo scanner.

AFM Atomic Force Microscopy - imaging surface topography

Multiview 1000^TM

Multiview 1000^TM

The Multiview 1000^TM is a complete system that is able to integrate AFM and NSOM with optical microscopy. It can be delivered with a microscope or combined with an existing inverted, upright or dual microscope. Multiview 1000^TM can be combined with a vide range of probes i.e. nanopipetts and probes for electrostatic measurements. The 3D flatscan gives a 70μm scanning range, even in Z wich is unique in the market. The system uses a normal force sensor for feedback, which is the standard method used in AFM. This allows the user to work in contact, non contact and intermittent contact mode.

For more information view the product broshure for Multiview 1000.

Multiview 2000^TM

Multiview 2000^TM

The Multiview 2000^TM is the next level instrument. It is equiped with two flatscan scanners which allows the user to perform the scan by either moving the sample or by moving the probe tip which. Depending on wich type of experiment this can be a crucial feature. The Multiview 2000^TM has also been designed to be the ideal choise when AFM/NSOM is to be integrated with spectroscopy tecniques like Raman and FTIR. Its slim design an the dual scanners are two features that contributes but the most important is that the feedback mechanism has been replaced. The laser used to get the feed back in normal AFM often cause inteferece with Raman signal. Multiview 2000^TM uses a tuning fork for feedback which eliminates the laser interference.

This instrument is available for measurements and demonstrations in the analysis lab at K-analys.

For more information view the product broshure for Multiview 2000.

Multiview 4000^TM single probe

Four probes working together

Multiview 4000^TM

The MultiView 4000^TM is the instrument for the most anvanced research and complex experiment setups. It used both a sample and a tip scanner. This system enables the use of up to four probes, optical fibers, nanopipetts or nano tweezers, that operates at the same location and can be controlled independently with nanometer precicion. Start with one probe upgrade to two, three or four as the complexity of the experiments increases. Using mutiple probes is especialy usefull when studying photonics and plasmonics when one probe can be used to deliver the light and another to meassure light distribution. Multiview 4000^TM uses a tuning fork for feedback which eliminates the laser interference.

For more information view the product broshure for Multiview 4000.

Cryo view 2000^TM is a system that enables you to do AFM and NSOM measurements in vacuum and at temperatures down to 25 K

For more information view the product broshure for CryoView 2000

NSOM, AFM combined with Raman or FTIR
In addition to this, if light from a visible laser is sent through the fiber, the light creates a Raman response when impinging on the sample surface. This Raman response can be collected through the microscope and
analysed in a Raman spectrometer. In this way the combination NSOM, AFM and Raman provides both sample topography and chemical information from very small areas of the sample. It is also possible to use tip enhanced raman spectroscopy, TERS. In this method a gold coated probe tip touches the sample surface in the point were the raman measurement is done. The Raman signal from the surface is then enhanced and it is possible to analyze coatings as thin as 15nm.

Read more in: Combining scanning probe microscopy and Raman microscopy
Read more in: TERS, Tip Enhanced Raman spectroscopy
Probes

The nanonics patented glass probes has an exposed tip geometry that enables two probes to work closely together and also to work together with microscopes spectrometers operating in reflective mode.

Exposed tip geometry Two probes meassuring at the same location

Examples of probes that can be used with the SPM techniques:

1. Glass probes that can be used as regular AFM probes od as optivalfibers for light delivery/collection.
2. Probes with a small metal droplet of gold or silver on the tip:
In NSOM/Raman mode, the signals tend to be very weak. These probes will produce SERS (Surface Enhanced Raman Spectroscopy) or sometimes SERRS (Surface Enhanced Resonance Raman Spectroscopy), and make the Raman signals several orders of magnitude more intense. The probes with a metal droplet on the tip can also be used for Evanescent light: The sample is placed on a prism and the laser light coupled to prism. When touching the sample with the metal particle tip, Evanescent light from the sample is detected by the spectrometer.
3. Hollow probes (Nanopipettes):
Chemical dosing can be done with Nanopipettes, an amount of a liquid can be precisely placed on a sample surface to induce local reactions. Volumes in the order of atto-litres can be administered.
4. Electrical probes:
A glass probe can have a metal wire protruding through the tip. These can form different types of thermocouples and electrodes, and by touching the sample surface electrical resistivity and also thermal conductivity can be measured.

It is also possible to use regular silicon probes with the Multiview systems. They are mounted on appropriate mounts.

For more information on different types of probes view: NSOM and SPM probes

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