K-Analys News and Applications letter 2006-1.
Dear scientist!
In this
news letter we will inform about how you can extract that extra information from
your samples by combining Raman, FT-IR, NSOM (NearField Scanning Optical
Microscopy) and AFM (Atomic Force Microscopy). We also have
an interesting Raman application presented by conservator Cecilia Rönnerstam, National Museum of
Fine Arts in Stockholm.
In the last news letter we presented Smiths
Detection's FT-IR and Ion Mobility Spectrometers. If you didn't get a chance
to read that news letter you can find it
here.
Portrait miniatures,
pigments from the 17th century and Advanced Raman
spectroscopy
In 1680 court miniaturist Elias Brenner created a document
on pigments recommended for miniature painting, containing
actual samples of each pigment. As part of a research project
by conservator Cecilia Rönnerstam at Swedish National Museum of Fine
Arts in Stockholm, these pigments are
currently being analysed at
K-Analys AB using Raman spectroscopy. The Raman technique
has found wide use in analysis of museum objects, the main reasons being
that no destructive sampling is needed from the original object and therefore the
artefact under investigation is not damaged. Forthcoming results from
the research project will show the samples chemical composition, and
can thereby be used to give an
idea of nomenclature, use and availability of paint pigments in
seventeenth century Stockholm.
Read more…
Foto: Hans Thorwid, Nationalmuseum
Combine the
InViaTM Raman spectrometer with FT-IR, NSOM and AFM
Raman spectroscopy is a vibrational
spectroscopy technique that makes it possible to study the back-bone
structure of the molecules, organic as well as inorganic.
An important complimentary technique to Raman is FT-IR spectroscopy
which can be applied to basically any compound and material.
An instrument with combined
Raman and FT-IR gives a unique possibility, since the two complimentary
techniques are applied at the same point of
your specimen.
NSOM enables you to look
beyond the diffraction limit of normal FarField optical microscopy. The aperture used is typically an optical fibre which has been
tapered down to a diameter of somewhere around 50-70 nm and being held
at about the same distance from the surface, creating an optical
resolution of 70-100 nm in practical work.
The optical fibre can at the same time also be used as an AFM probe. AFM is the
technique for imaging surface topography with nanometer resolution.
If light from a laser is sent through
the NSOM fiber it creates a Raman response when impinging on the
sample surface. This Raman response, now with NearField optical
resolution, can be collected by the
microscope and analysed in a Raman spectrometer. In this way the
combination NSOM, AFM and Raman provides both sample topography and
chemical
information from very small areas of the sample.
Our suppliers in this area
Renishaw (Raman spectrometers), Nanonics (AFM and NSOM) and Smiths
Detection (FT-IR) have developed high performance and high quality
instruments for research and industry. Their instruments are designed to be compatible with
each other.
You will find more information on our website...
Thank you for taking your time to read our news and applications letter. If you have an interest in our products you have an excellent chance to try out both Raman and FT-IR spectroscopy in our lab. Contact us at telephone number +46 (0)18 15 78 00 and we can explain how we can assist you with analysing your samples.
With best regards.
Carl Dinges
Marketing manager
K-Analys AB
K-Analys AB, Salagatan 16 F, 753 30 Uppsala, Sweden. Tel. +46 (0)18 15 78 00 or
+46 (0)18 59 05 75
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